• DocumentCode
    1342242
  • Title

    Reliability assessment in electrical power systems: the Weibull-Markov stochastic model

  • Author

    Van Casteren, Jasper F L ; Bollen, Math H J ; Schmieg, Martin E.

  • Author_Institution
    DIgSILENT GmbH, Gomaringen, Germany
  • Volume
    36
  • Issue
    3
  • fYear
    2000
  • Firstpage
    911
  • Lastpage
    915
  • Abstract
    The field of power system reliability is dominated by the use of homogenous Markov models. The negative exponential distributions in these models, however, are unrealistic in the case of repair or switching times. The use of homogenous Markov models is often justified by arguing that the use of other models makes it impossible to perform analytical or nonsequential calculations. It is shown in this paper that this is not the case. A special kind of semi-Markov model is proposed which uses Weibull distributions for all stochastic durations, which enables analytical calculations. The proposed model contains the homogenous Markov model as a subset, enables bell-shaped duration distributions, and may be used in various analytical and nonsequential reliability assessment methods
  • Keywords
    Markov processes; Weibull distribution; exponential distribution; power system reliability; stochastic processes; Weibull distributions; Weibull-Markov stochastic model; bell-shaped duration distributions; electrical power systems; homogenous Markov models; negative exponential distributions; nonsequential reliability assessment methods; power system reliability; reliability assessment; reliability worth; repair times; semi-Markov model; stochastic durations; switching times; Exponential distribution; Frequency; Industrial power systems; Mathematical model; Power system analysis computing; Power system modeling; Power system reliability; Stochastic processes; Stochastic systems; Weibull distribution;
  • fLanguage
    English
  • Journal_Title
    Industry Applications, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-9994
  • Type

    jour

  • DOI
    10.1109/28.845070
  • Filename
    845070