Title :
Optocouplers: Fundamentals and Hardness Assurance for Space Applications
Author :
Johnston, A.H. ; Harris, R.D. ; Miyahira, T.F.
Author_Institution :
Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
Abstract :
Operating principles and hardness assurance methods are discussed for various types of optocouplers. Radiation damage in light-emitting diodes is addressed, along with the impact of phototransistors and internal amplifiers on overall performance. Hardness assurance for optocouplers is contrasted with the approach used for conventional microelectronics. Methods of detecting abnormal devices are discussed, along with the implementation of special screening measurements.
Keywords :
aerospace instrumentation; amplifiers; light emitting diodes; phototransistors; radiation hardening (electronics); abnormal device detection; conventional microelectronics; hardness assurance methods; internal amplifiers; light-emitting diodes; operating principles; optocouplers; phototransistors; radiation damage; screening measurements; space applications; Degradation; Detectors; Light emitting diodes; MOSFETs; Optical amplifiers; Photoconductivity; Phototransistors; Protons; Radiation effects; Space technology; Displacement damage; hardness assurance; optocoupler; proton damage; space radiation effects;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2009.2033685
