DocumentCode :
1342360
Title :
Nonlinearity and hysteresis of resonant strain gauges
Author :
Gui, Chengqun ; Legtenberg, Rob ; Tilmans, Harrie A C ; Fluitman, Jan H J ; Elwenspoek, Miko
Author_Institution :
MESA Res. Inst., Twente Univ., Enschede, Netherlands
Volume :
7
Issue :
1
fYear :
1998
fDate :
3/1/1998 12:00:00 AM
Firstpage :
122
Lastpage :
127
Abstract :
The nonlinearity and hysteresis effects of the electrostatically activated voltage-driven resonant microbridges have been studied theoretically and experimentally. It is shown that in order to avoid vibration instability and hysteresis to occur, the choices of the ac and dc driving voltages and of the quality factor of a resonator, with a given geometry and choice of materials, are limited by a hysteresis criterion. The limiting conditions are also formulated as the hysteresis-free design rules. Expressions for the maximum allowable quality factor and maximum attainable figure of merit are given. Experimental results, as obtained from electrostatically driven vacuum-encapsulated low-pressure chemical-vapor deposition (LPCVD) polysilicon microbridges, are presented and show good agreement with the theory
Keywords :
Q-factor; bridge instruments; hysteresis; micromechanical resonators; microsensors; strain gauges; Si; design rule; driving voltage; electrostatic activation; figure of merit; hysteresis; nonlinearity; quality factor; resonant strain gauge; resonator; vacuum-encapsulated LPCVD polysilicon microbridge; vibration instability; Capacitive sensors; Frequency; Geometry; Hysteresis; Microcavities; Q factor; Resonance; Springs; Tensile stress; Voltage;
fLanguage :
English
Journal_Title :
Microelectromechanical Systems, Journal of
Publisher :
ieee
ISSN :
1057-7157
Type :
jour
DOI :
10.1109/84.661394
Filename :
661394
Link To Document :
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