Title :
Electron Nonionizing Energy Loss for Device Applications
Author :
Jun, Insoo ; Kim, Wousik ; Evans, Robin
Author_Institution :
Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
Abstract :
The electron induced nonionizing energy loss (NIEL) for representative device and detector materials are presented here. The electron NIELs are computed analytically using the Mott differential cross section. As for the partition function, which describes the portion of energy deposited into displacing lattice atoms, the expression recently developed by Akkerman was used that better fits for the low recoil energy.
Keywords :
aluminium; energy loss of particles; space vehicle electronics; Lindhard partition function; Mott differential cross section; aluminum shields; damage dose; detector materials; electron induced nonionizing energy loss; recoil energy; space missions; Atomic layer deposition; Detectors; Electrons; Energy loss; Jupiter; Optical materials; Protons; Semiconductor materials; Space missions; Space technology; Lindhard partition function; Mott cross section; nonionizing energy loss (NIEL);
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2009.2033692
