Title :
General Framework for Single Event Effects Rate Prediction in Microelectronics
Author :
Weller, Robert A. ; Reed, Robert A. ; Warren, Kevin M. ; Mendenhall, Marcus H. ; Sierawski, Brian D. ; Schrimpf, Ronald D. ; Massengill, Lloyd W.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Vanderbilt Univ., Nashville, TN, USA
Abstract :
A comprehensive mathematical framework is established that encompasses both Monte Carlo single event effects (SEE) rate prediction and analytical approximations based on a single rectangular parallelepiped (RPP). Criteria derived from consideration of multiple devices and technologies are presented that are useful in identifying situations where RPP-model predictions of SEE rates may not be appropriate and should be augmented or replaced by advanced physical modeling.
Keywords :
Monte Carlo methods; integrated circuit modelling; GEANT; Monte Carlo single event effects rate prediction; comprehensive mathematical framework; microelectronics; single rectangular parallelepiped; Appropriate technology; Art; Circuits; Helium; Mathematical model; Microelectronics; Monte Carlo methods; Predictive models; Quantum computing; Space technology; GEANT; Monte Carlo simulation; mathematical modeling; radiation transport modeling; single event effects; single event modeling; single event rates;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2009.2033916
