Title :
TPA Laser and Heavy-Ion SEE Testing: Complementary Techniques for SDRAM Single-Event Evaluation
Author :
Ladbury, Ray L. ; Benedetto, Joe ; McMorrow, Dale ; Buchner, Stephen P. ; LaBel, Kenneth A. ; Berg, Melanie D. ; Kim, Hak S. ; Sanders, Anthony B. ; Friendlich, Mark R. ; Phan, Anthony
Author_Institution :
c/o NASA Goddard Space Flight Center (GSFC), MEI Technol. Inc., Greenbelt, MD, USA
Abstract :
We report on complementary use of two-photon absorption laser and heavy-ion SEE testing to evaluate the single-event response of SDRAMs. The tandem testing technique helps disentangle the response of devices exhibiting multiple SEE modes.
Keywords :
DRAM chips; laser beam applications; logic testing; radiation hardening (electronics); two-photon processes; SDRAM single-event evaluation; TPA laser; heavy-ion SEE testing; tandem testing technique; two-photon absorption laser; Absorption; Delay; Error analysis; Error correction; Laser modes; Metallization; Packaging; SDRAM; Space technology; Testing; Quality assurance; SDRAMs; reliability estimation; single-event effects;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2009.2033690
