Irradiation With Molecular Hydrogen as an Accelerated Total Dose Hardness Assurance Test Method for Bipolar Linear Circuits

Author

Adell, Philippe C. ; Pease, Ronald L. ; Barnaby, Hugh J. ; Rax, Bernard ; Chen, Xiao J. ; McClure, Steven S.

Author_Institution

Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA

Volume

56

Issue

6

fYear

2009

Firstpage

3326

Lastpage

3333

Abstract

High dose rate irradiation with hydrogen stress is proposed as an accelerated total dose test method for bipolar linear circuits. The method is validated across process and circuit technologies with five parts that are commonly used in space: a comparator (LM193 from National Semiconductor), a voltage regulator (HSYE-117 RH from Intersil), a voltage reference (LT1019 from Linear Technology), a JFET input op amp (OP42 from Analog Devices) and a temperature transducer (AD590 from Analog Devices). The testing technique could rapidly establish an upper bound to the low dose rate response of parts in space and help with the part selection process in the design phase of a mission. Radiation hardness assurance implications are discussed.

Keywords

bipolar analogue integrated circuits; comparators (circuits); hardness testing; hydrogen; integrated circuit testing; junction gate field effect transistors; life testing; operational amplifiers; radiation hardening (electronics); temperature sensors; AD590; H₂; HSYE-117 RH; JFET input op amp; LM193; LT1019; OP42; accelerated total dose hardness assurance test method; analog devices; bipolar linear circuits; comparator; high dose rate irradiation; molecular hydrogen; temperature transducer; voltage reference; voltage regulator; Circuit testing; Hydrogen; JFET circuits; Life estimation; Linear circuits; Operational amplifiers; Regulators; Space technology; Stress; Voltage; Accelerated testing; dose rate; enhanced low-dose rate sensitivity; hydrogen; interface traps; radiation effects; radiation hardness assurance; total ionizing dose;

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/TNS.2009.2033797

Filename

5341383