Title :
Irradiation With Molecular Hydrogen as an Accelerated Total Dose Hardness Assurance Test Method for Bipolar Linear Circuits
Author :
Adell, Philippe C. ; Pease, Ronald L. ; Barnaby, Hugh J. ; Rax, Bernard ; Chen, Xiao J. ; McClure, Steven S.
Author_Institution :
Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
Abstract :
High dose rate irradiation with hydrogen stress is proposed as an accelerated total dose test method for bipolar linear circuits. The method is validated across process and circuit technologies with five parts that are commonly used in space: a comparator (LM193 from National Semiconductor), a voltage regulator (HSYE-117 RH from Intersil), a voltage reference (LT1019 from Linear Technology), a JFET input op amp (OP42 from Analog Devices) and a temperature transducer (AD590 from Analog Devices). The testing technique could rapidly establish an upper bound to the low dose rate response of parts in space and help with the part selection process in the design phase of a mission. Radiation hardness assurance implications are discussed.
Keywords :
bipolar analogue integrated circuits; comparators (circuits); hardness testing; hydrogen; integrated circuit testing; junction gate field effect transistors; life testing; operational amplifiers; radiation hardening (electronics); temperature sensors; AD590; H2; HSYE-117 RH; JFET input op amp; LM193; LT1019; OP42; accelerated total dose hardness assurance test method; analog devices; bipolar linear circuits; comparator; high dose rate irradiation; molecular hydrogen; temperature transducer; voltage reference; voltage regulator; Circuit testing; Hydrogen; JFET circuits; Life estimation; Linear circuits; Operational amplifiers; Regulators; Space technology; Stress; Voltage; Accelerated testing; dose rate; enhanced low-dose rate sensitivity; hydrogen; interface traps; radiation effects; radiation hardness assurance; total ionizing dose;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2009.2033797
