DocumentCode
1342588
Title
Editorial Conference Comments by the General Chairman
Author
Hopkins, M.A.
Author_Institution
Aerosp. Corp., Albuquerque, NM, USA
Volume
56
Issue
6
fYear
2009
Firstpage
3018
Lastpage
3020
Abstract
This paper tells about the comments given by the general chairman in the 2009 conference at Quebec City´s Hilton and convection centre in the province of Quebec, canada. NSREC is recoginized as one of the premier international conference on radiation effects in electronic materials, devices and systems. Also the radiation effects in microelectronic devices and materials are discussed. Reliability effects in electronic device is also given in the conference.
Keywords
integrated circuit reliability; integrated circuit testing; radiation effects; semiconductor device reliability; editorial conference comments; electronic materials; general chairman; microelectronic devices; radiation effects; reliability effects;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.2009.2035395
Filename
5341389
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