DocumentCode :
1342632
Title :
High-performance heterodyne optical injection phase-lock loop using wide linewidth semiconductor lasers
Author :
Walton, C. ; Bordonalli, A.C. ; Seeds, A.J.
Author_Institution :
Dept. of Electron. & Electr. Eng., Univ. Coll. London, UK
Volume :
10
Issue :
3
fYear :
1998
fDate :
3/1/1998 12:00:00 AM
Firstpage :
427
Lastpage :
429
Abstract :
The requirements for narrow linewidth lasers or short-loop propagation delay limit optical phase-lock loop realizability with semiconductor lasers. Although optical injection locking can provide low-phase-error variance, its locking range is limited by stability considerations. The first experimental results for an heterodyne optical injection phase-lock loop are reported. Phase-error variance as low as 0.003 rad/sup 2/ in a bandwidth of 100 MHz, single-sideband (SSB) noise density of -94 dBc/Hz at 10-kHz offset and mean time to cycle slip of 3/spl times/10/sup 10/ s have been achieved using DFB lasers of 36-MHz summed linewidth, a loop propagation delay of 20 ns and an injection ratio of -30 dB.
Keywords :
demodulation; electro-optical modulation; laser noise; laser stability; optical phase locked loops; optical transmitters; semiconductor device noise; semiconductor lasers; spectral line breadth; 100 MHz; 20 ns; cycle slip; heterodyne optical injection phase-lock loop; high-performance heterodyne optical injection phase-lock loop; injection ratio; locking range; loop propagation delay; low-phase-error variance; narrow linewidth lasers; optical injection locking; phase-error variance; semiconductor lasers; short-loop propagation delay limit optical phase-lock loop realizability; single-sideband noise density; stability considerations; summed linewidth; wide linewidth semiconductor lasers; Amplitude modulation; Bandwidth; Injection-locked oscillators; Laser noise; Optical mixing; Optical noise; Propagation delay; Semiconductor lasers; Signal to noise ratio; Stability;
fLanguage :
English
Journal_Title :
Photonics Technology Letters, IEEE
Publisher :
ieee
ISSN :
1041-1135
Type :
jour
DOI :
10.1109/68.661432
Filename :
661432
Link To Document :
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