DocumentCode :
1342670
Title :
Noise mechanisms and error rates in multiwavelength optical storage
Author :
Wullert, John R. ; Lu, Yicheng
Author_Institution :
Bellcore, Red Bank, NJ, USA
Volume :
10
Issue :
3
fYear :
1998
fDate :
3/1/1998 12:00:00 AM
Firstpage :
445
Lastpage :
447
Abstract :
Optical storage is attractive for its high information density and, in the case of compact disks, its robustness. We have been investigating a novel means of improving the storage density of compact disks through the use of multiple wavelengths of light, interacting with distinct physical levels of storage on a single disk. In storage technologies, signal to noise ratios, and the resulting error rates are critical parameters in determining proper performance. This letter describes the theoretical examination of noise mechanisms and error rates in a multiwavelength, multilevel optical storage structure.
Keywords :
errors; optical disc storage; optical noise; compact disks; error rates; high information density; multiple wavelengths; multiwavelength multilevel optical storage structure; multiwavelength optical storage; noise mechanisms; robustness; signal to noise ratios; single disk; storage density; storage technologies; CD recording; Dielectrics; Error analysis; Mirrors; Noise level; Nonhomogeneous media; Optical noise; Optical refraction; Reflectivity; Signal to noise ratio;
fLanguage :
English
Journal_Title :
Photonics Technology Letters, IEEE
Publisher :
ieee
ISSN :
1041-1135
Type :
jour
DOI :
10.1109/68.661438
Filename :
661438
Link To Document :
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