• DocumentCode
    1342670
  • Title

    Noise mechanisms and error rates in multiwavelength optical storage

  • Author

    Wullert, John R. ; Lu, Yicheng

  • Author_Institution
    Bellcore, Red Bank, NJ, USA
  • Volume
    10
  • Issue
    3
  • fYear
    1998
  • fDate
    3/1/1998 12:00:00 AM
  • Firstpage
    445
  • Lastpage
    447
  • Abstract
    Optical storage is attractive for its high information density and, in the case of compact disks, its robustness. We have been investigating a novel means of improving the storage density of compact disks through the use of multiple wavelengths of light, interacting with distinct physical levels of storage on a single disk. In storage technologies, signal to noise ratios, and the resulting error rates are critical parameters in determining proper performance. This letter describes the theoretical examination of noise mechanisms and error rates in a multiwavelength, multilevel optical storage structure.
  • Keywords
    errors; optical disc storage; optical noise; compact disks; error rates; high information density; multiple wavelengths; multiwavelength multilevel optical storage structure; multiwavelength optical storage; noise mechanisms; robustness; signal to noise ratios; single disk; storage density; storage technologies; CD recording; Dielectrics; Error analysis; Mirrors; Noise level; Nonhomogeneous media; Optical noise; Optical refraction; Reflectivity; Signal to noise ratio;
  • fLanguage
    English
  • Journal_Title
    Photonics Technology Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1041-1135
  • Type

    jour

  • DOI
    10.1109/68.661438
  • Filename
    661438