Title :
Flip-Flop Upsets From Single-Event-Transients in 65 nm Clock Circuits
Author :
Wissel, Larry ; Heidel, David F. ; Gordon, Michael S. ; Rodbell, Kenneth P. ; Stawiasz, Kevin ; Cannon, Ethan H.
Author_Institution :
IBM Syst. & Technol. Group, Essex Junction, VT, USA
Abstract :
This paper describes upsets of 65 nm flip-flops caused by Single-Event-Transients in clock-tree circuits. The upset rate is predicted through modeling, and compared to upset rates measured on a 65 nm test chip with 15 MeV carbon ions and 148 MeV protons.
Keywords :
clocks; flip-flops; carbon ions; clock circuits; clock-tree circuits; electron volt energy 148 MeV; electron volt energy 15 MeV; flip-flop upsets; protons; single-event-transients; size 65 nm; Circuits; Clocks; Flip-flops; Master-slave; Neutrons; Packaging; Predictive models; Protons; Semiconductor device measurement; Testing; Flip-flop; single-event transient; soft error;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2009.2033997
