• DocumentCode
    1342731
  • Title

    Development of Hardware In-the-Loop Simulation System for Testing Operation and Control Functions of Microgrid

  • Author

    Jeon, Jin-Hong ; Kim, Jong-Yul ; Kim, Hak-Man ; Kim, Seul-Ki ; Cho, Changhee ; Kim, Jang-Mok ; Ahn, Jong-Bo ; Nam, Kee-Young

  • Author_Institution
    New & Renewable Energy Syst. Res. Center, Korea Electrotechnol. Res. Inst., Changwon, South Korea
  • Volume
    25
  • Issue
    12
  • fYear
    2010
  • Firstpage
    2919
  • Lastpage
    2929
  • Abstract
    This paper proposes a hardware in-the-loop simulation (HILS) system as a new method to develop and test control algorithms and operation strategies for a microgrid. The HILS system is composed of a real-time digital simulator (RTDS) for real-time simulation of the microgrid, a prototype microgrid management system (MMS) under test, and a communication emulator for interface between the prototype MMS and the RTDS. The prototype MMS is designed to operate microsources of microgrid and to control power flow at the point of common coupling (PCC) in the grid-connected mode, and voltages and frequency in the islanded mode of the microgrid. The MMS is tested in the grid-connected mode and in the islanded mode, respectively, to show the validation of the proposed HILS system.
  • Keywords
    digital simulation; distributed power generation; power engineering computing; power grids; power system control; power system management; testing; communication emulator; grid connected mode; hardware in-the-loop simulation; microgrid control function; microgrid management system; microgrid testing operation; operation strategy; real time digital simulator; test control algorithm; Embedded system; Frequency control; Generators; Prototypes; Real time systems; Switches; Voltage control; Hardware in-the-loop simulation (HILS) system; microgrid; microgrid management system (MMS); real-time digital simulator (RTDS);
  • fLanguage
    English
  • Journal_Title
    Power Electronics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-8993
  • Type

    jour

  • DOI
    10.1109/TPEL.2010.2078518
  • Filename
    5594649