Title :
A Bias-Dependent Single-Event Compact Model Implemented Into BSIM4 and a 90 nm CMOS Process Design Kit
Author :
Kauppila, Jeffrey S. ; Sternberg, Andrew L. ; Alles, Michael L. ; Francis, A. Matt ; Holmes, Jim ; Amusan, Oluwole A. ; Massengill, Lloyd W.
Author_Institution :
Inst. for Space & Defense Electron., Vanderbilt Univ., Nashville, TN, USA
Abstract :
A single-event model capable of capturing bias- dependent effects has been developed and integrated into the BSIM4 transistor model and a 90 nm CMOS process design kit. Simulation comparisons with mixed mode TCAD are presented.
Keywords :
CMOS integrated circuits; MOSFET; SPICE; BSIM4 transistor model; CMOS process design kit; MOSFETs; SPICE; bias-dependent single-event compact model; integrated circuit radiation effects; mixed mode TCAD; CMOS process; Circuit simulation; Circuit testing; Computational modeling; MOS devices; MOSFETs; Process design; Pulse circuits; SPICE; Semiconductor device modeling; Integrated circuit radiation effects; MOSFETs; SPICE; single-event effects;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2009.2033798
