Title :
Investigation of Polysilicon Thin-Film Transistor Technology for RF Applications
Author :
Chen, Yi-Jan Emery ; Lee, Yuan-Jiang ; Yu, Yueh-Hua
Author_Institution :
Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
Abstract :
The low-temperature polycrystalline silicon (LTPS) thin-film transistor (TFT) is an emerging technology to manufacture active matrix liquid crystal displays. With the TFT´s maximum frequency of oscillation fmax exceeding 3.5 GHz, it becomes feasible to develop integrated circuits (ICs) in LTPS TFT technology to facilitate system on panel or system on display. This paper investigates the LTPS TFT characteristics for developing RF ICs. The dc and ac equivalent-circuit models were developed for LTPS TFT RF integrated-circuit design. A phase-locked loop (PLL) was demonstrated using the 3-μm LTPS TFT technology. The supply voltage and power consumption of the PLL are 8.4 V and 25 mW, respectively. The operation frequency range of the TFT PLL is from 2 to 10 MHz, and the measured root-mean-square jitter is 235 ps.
Keywords :
MMIC; elemental semiconductors; equivalent circuits; integrated circuit design; integrated circuit modelling; liquid crystal displays; microwave transistors; phase locked loops; silicon; thin film transistors; AC equivalent-circuit models; DC equivalent-circuit models; LTPS TFT RF integrated-circuit design; PLL; RFIC; Si; active matrix liquid crystal displays; frequency 2 MHz to 10 MHz; integrated circuits; low-temperature polycrystalline silicon; measured root-mean-square jitter; operation frequency; phase-locked loop; polysilicon thin-film transistor technology; power 25 mW; power consumption; size 3 mum; system on display; system on panel; time 235 ns; voltage 8.4 V; Glass; Integrated circuit modeling; Mathematical model; Phase locked loops; Radio frequency; Resistance; Thin film transistors; Integrated circuits (ICs); RF; liquid crystal display (LCD); phase-locked loop (PLL); polysilicon; system on panel (SoP); thin-film transistor (TFT);
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
DOI :
10.1109/TMTT.2010.2076911