• DocumentCode
    1342798
  • Title

    Radioactive Nuclei Induced Soft Errors at Ground Level

  • Author

    Wrobel, Frédéric ; Saigné, Frédéric ; Gedion, Michael ; Gasiot, Jean ; Schrimpf, Ronald D.

  • Author_Institution
    Univ. of Montpellier II, Montpellier, France
  • Volume
    56
  • Issue
    6
  • fYear
    2009
  • Firstpage
    3437
  • Lastpage
    3441
  • Abstract
    The role of all natural alpha emitters on the soft-error rate of integrated circuits is quantified. The impact of seven materials is given in FIT per mass unit. For instance, platinum has an isotope that is a natural alpha emitter, which may increase the Soft Error Rate up to 53 FIT/ng. Moreover, secular equilibrium of uranium is simulated by a Monte Carlo method. Only 90 parts per trillion of uranium is enough to explain the emissivity of wafers. Simulations show the trends of the alpha SER with scaling from the 250 nm technology node down to the 90 nm node. The contribution of alpha particles emitted by impurities to the SER is shown to become more important as the feature size decreases.
  • Keywords
    Monte Carlo methods; alpha-particle effects; emissivity; error statistics; hafnium; integrated circuit technology; platinum; radioisotopes; semiconductor device models; uranium; Hf; Monte Carlo method; Pt; SER; U; alpha emitters; hafnium; integrated circuits; platinum; radioactive nuclei induced soft errors; radionuclides; uranium; Alpha particles; Circuit simulation; Error analysis; Hafnium; Impurities; Isotopes; Neutrons; Platinum; Radioactive materials; Single event upset; Alpha emitters; hafnium; platinum; secular equilibrium; soft error rate; uranium;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2009.2033363
  • Filename
    5341418