DocumentCode
1342798
Title
Radioactive Nuclei Induced Soft Errors at Ground Level
Author
Wrobel, Frédéric ; Saigné, Frédéric ; Gedion, Michael ; Gasiot, Jean ; Schrimpf, Ronald D.
Author_Institution
Univ. of Montpellier II, Montpellier, France
Volume
56
Issue
6
fYear
2009
Firstpage
3437
Lastpage
3441
Abstract
The role of all natural alpha emitters on the soft-error rate of integrated circuits is quantified. The impact of seven materials is given in FIT per mass unit. For instance, platinum has an isotope that is a natural alpha emitter, which may increase the Soft Error Rate up to 53 FIT/ng. Moreover, secular equilibrium of uranium is simulated by a Monte Carlo method. Only 90 parts per trillion of uranium is enough to explain the emissivity of wafers. Simulations show the trends of the alpha SER with scaling from the 250 nm technology node down to the 90 nm node. The contribution of alpha particles emitted by impurities to the SER is shown to become more important as the feature size decreases.
Keywords
Monte Carlo methods; alpha-particle effects; emissivity; error statistics; hafnium; integrated circuit technology; platinum; radioisotopes; semiconductor device models; uranium; Hf; Monte Carlo method; Pt; SER; U; alpha emitters; hafnium; integrated circuits; platinum; radioactive nuclei induced soft errors; radionuclides; uranium; Alpha particles; Circuit simulation; Error analysis; Hafnium; Impurities; Isotopes; Neutrons; Platinum; Radioactive materials; Single event upset; Alpha emitters; hafnium; platinum; secular equilibrium; soft error rate; uranium;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.2009.2033363
Filename
5341418
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