Development of a Versatile Test Platform for Single Event Effect (SEE) Characterization of Analog, Digital and Mixed-Signals Integrated Circuits (ICs)

Author

Valsecchi, Nicolas ; Gloutnay, Eric ; Pellerin, Tony ; Cusson, Jean-Francois ; Lafrance, Sébastien ; Hardy, Julie ; Brassard, Gilles

Author_Institution

Space Technol., Canadian Space Agency, Longueuil, QC, Canada

Volume

56

Issue

6

fYear

2009

Firstpage

3341

Lastpage

3346

Abstract

This paper describes a versatile test platform developed by the Canadian Space Agency (CSA), relying on a configurable Digital Comparator and Analog Multitrig Unit (DCAMU), aimed at detecting and counting single-event effects (SEEs) for a variety of electronic devices under radiation testing.

Keywords

analogue integrated circuits; comparators (circuits); digital integrated circuits; mixed analogue-digital integrated circuits; Canadian space agency; DCAMU; SEE characterization; analog integrated circuits; configurable digital comparator and analog multitrig unit; digital integrated circuits; electronic devices; mixed-signal integrated circuits; radiation testing; single event effect; versatile test platform; Circuit testing; Costs; Data acquisition; Electronic equipment testing; Event detection; Integrated circuit testing; Mixed analog digital integrated circuits; Radiation detectors; Single event upset; Space technology; Environmental testing; integrated circuit (IC) testing; integrated circuit radiation effect; single event effect; test equipment;

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/TNS.2009.2032864

Filename

5341421