Title :
Theoretical model for intravalley and intervalley free-carrier absorption in semiconductor lasers: beyond the classical Drude model
Author :
Tsai, Chin-Yi ; Tsai, Chin-Yao ; Chen, Chih-Hsiung ; Sung, Tien-Li ; Wu, Tsu-Yin ; Shih, Fang-Ping
Author_Institution :
Dept. of Electron. & Electr. Eng., De Monfort Univ., Leicester, UK
fDate :
3/1/1998 12:00:00 AM
Abstract :
Free-carrier absorption is calculated from the second-order perturbation theory of quantum mechanics by considering the interactions between carriers and polar optical phonons, deformation potential optical phonons, deformation potential acoustic phonons, piezoelectric acoustic phonons, and charged impurities in the intravalley transition and the intervalley transition. A formula is derived from our theoretical model for the coefficient of free-carrier absorption by incorporating the state-filling effect and the degenerate carrier distribution. Our results indicate that the classical Drude model is inadequate to describe many features of the free-carrier absorption. Alternatively, our theoretical model may provide an efficient method for investigating the effect of free-carrier absorption on the functionality or performance of the related optoelectronic device
Keywords :
laser theory; perturbation theory; phonons; semiconductor device models; semiconductor lasers; charged impurities; classical Drude model; deformation potential acoustic phonons; deformation potential optical phonons; degenerate carrier distribution; free-carrier absorption; intervalley free-carrier absorption; intervalley transition; intravalley free-carrier absorption; intravalley transition; optoelectronic device; piezoelectric acoustic phonons; polar optical phonons; quantum mechanics; second-order perturbation theory; semiconductor lasers; state-filling effect; theoretical model; Absorption; Electron optics; Laser modes; Laser theory; Optical control; Optical losses; Optical refraction; Optical variables control; Phonons; Semiconductor lasers;
Journal_Title :
Quantum Electronics, IEEE Journal of