Title :
Single Event Transient Response Dependence on Operating Conditions for a Digital to Analog Converter
Author :
Kruckmeyer, Kirby ; Prater, James S. ; Brown, Bill ; DasGupta, Sandeepan
Author_Institution :
Nat. Semicond., Santa Clara, CA, USA
Abstract :
The Single Event Effect (SEE) characterization of a Digital to Analog Converter showed an unexpected Single Event Transient (SET) dependence on operating conditions. The worst case condition resulting in the highest probability of an SET was at the highest supply voltage. The SET signatures were dependent on the input code, with some signatures not present when the input code was at mid scale. The SET characterization results are presented, along with a simulation study that explains the SET response dependence on the operating conditions. These results emphasize the importance of running an SEE characterization on a mixed signal product and monitoring all aspects of the SET signatures, including probability, amplitude, pulse width and oscillatory behavior, to determine the worst case operating conditions.
Keywords :
digital-analogue conversion; probability; radiation hardening (electronics); SEE characterization; SET dependence; digital to analog converter; input code; mixed signal product; operating conditions; oscillatory behavior; probability; pulse width; single event effect; single event transient; Circuit simulation; Clocks; Condition monitoring; Digital-analog conversion; Measurement standards; Single event upset; Space vector pulse width modulation; Testing; Transient response; Voltage; Digital to analog converter (DAC); mixed signal; single event transient (SET); single event upset (SEU);
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2009.2022161