• DocumentCode
    1343191
  • Title

    Contour matching using epipolar geometry

  • Author

    Han, Joon Hee ; Park, Jong Seung

  • Author_Institution
    Dept. of Comput. Sci. & Eng., Pohang Univ. of Sci. & Technol., South Korea
  • Volume
    22
  • Issue
    4
  • fYear
    2000
  • fDate
    4/1/2000 12:00:00 AM
  • Firstpage
    358
  • Lastpage
    370
  • Abstract
    Matching features computed in images is an important process in multiview image analysis. When the motion between two images is large, the matching problem becomes very difficult. In this paper, we propose a contour matching algorithm based on geometric constraints. With the assumption that the contours are obtained from images taken from a moving camera with static scenes, we apply the epipolar constraint between two sets of contours and compute the corresponding points on the contours. From the initial epipolar constraints obtained from corner point matching, candidate contours are selected according to the epipolar geometry, contour end point constraints, and contour distance measures. In order to reduce the possibility of false matches, the number of match points on a contour is also used as a selection measure. The initial epipolar constraint is refined from the matched sets of contours. The algorithm can be applied to a pair or two pairs of images. All of the processes are fully automatic and successfully implemented and tested with various real images
  • Keywords
    computational geometry; image matching; image motion analysis; stereo image processing; contour distance measures; contour end point constraints; contour matching; corner point matching; epipolar geometry; false matches; geometric constraints; multiview image analysis; static scenes; Algorithm design and analysis; Automatic testing; Cameras; Computer vision; Image motion analysis; Image segmentation; Information geometry; Layout; Motion estimation; Robustness;
  • fLanguage
    English
  • Journal_Title
    Pattern Analysis and Machine Intelligence, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0162-8828
  • Type

    jour

  • DOI
    10.1109/34.845378
  • Filename
    845378