DocumentCode :
1343288
Title :
Bayesian Lower Bounds on Reliability for the Lognormal Model
Author :
Padgett, W.J. ; Wei, L.J.
Author_Institution :
Department of Mathematics and Computer Science; University of South Carolina; Columbia, South Carolina 29208 USA.
Issue :
2
fYear :
1978
fDate :
6/1/1978 12:00:00 AM
Firstpage :
161
Lastpage :
165
Abstract :
Bayesian lower bounds for the reliability function are obtained for the lognormal failure model with respect to the s-normal-gamma (conjugate) prior distribution and a vague prior distribution of Jeffreys. The Bayesian lower bound with respect to the vague prior is the same as the uniformly most accurate (UMA) lower s-confidence bound for reliability. All lower bounds are given in terms of the noncentrality parameter of a generalized noncentral t-distribution. A simple approximation for the noncentrality parameter is discussed. Computer simulation results indicate how well the approximation performs and provide a performance comparison between the Bayes lower bounds with respect to the (proper) s-normal-gamma prior and the UMA lower s-confidence bound. The two measures used in the simulations to evaluate performance of the lower bounds are 1) the average difference between the computed lower bound and the true reliability and 2) the fraction of computed lower bounds which are actually less than the true reliability. This Bayes procedure performs very well even though the assumed prior information is not exactly correct; and the approximation is used to obtain the lower bounds.
Keywords :
Art; Bayesian methods; Computational modeling; Knowledge engineering; Life estimation; Life testing; Probability; Reliability engineering; Reliability theory; Statistical distributions; Bayesian lower bounds; Lognormal failure model; Uniformly most accurate lower s-confidence bound; Vague prior; s-Normal-gamma priors;
fLanguage :
English
Journal_Title :
Reliability, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9529
Type :
jour
DOI :
10.1109/TR.1978.5220294
Filename :
5220294
Link To Document :
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