Title :
A 1.5 GHz phase-locked loop with leakage current suppression in 65 nm CMOS
Author :
Chang, Jen-Yuan ; Liu, Shen-Iuan
Author_Institution :
Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
fDate :
12/1/2009 12:00:00 AM
Abstract :
In the nanoscale CMOS process, the problem of leakage current causes the performance of the analog circuits to degrade. The leakage current of a loop filter, which is realised by MOS capacitors, significantly degrades the jitter performance of a phase-locked loop. A leakage suppression circuit is presented by using a combination of switchable varactors and current sources to compensate the leakage of MOS capacitors in a loop filter. This PLL has been fabricated in a 65 nm CMOS process and the core area is 0.4 0.5 mm2. With the leakage suppression circuit, the peak-to-peak jitter and the RMS jitter are 43 and 5.36 ps, respectively. The power is 17 mW for a 1.2 V supply.
Keywords :
CMOS analogue integrated circuits; MOS capacitors; UHF filters; UHF integrated circuits; jitter; leakage currents; phase locked loops; varactors; MOS capacitors; analog circuits; frequency 1.5 GHz; jitter; leakage current suppression; leakage suppression circuit; loop filter; nanoscale CMOS process; peak-to-peak jitter; phase-locked loop; power 17 mW; size 65 nm; switchable varactors; voltage 1.2 V;
Journal_Title :
Circuits, Devices & Systems, IET
DOI :
10.1049/iet-cds.2009.0097