• DocumentCode
    1343343
  • Title

    Typical error pattern recovery of the Hopfield memory under error-tolerant conditions

  • Author

    Burshtein, David

  • Author_Institution
    Dept. of Electr. Eng.-Syst., Tel Aviv Univ., Israel
  • Volume
    44
  • Issue
    2
  • fYear
    1998
  • fDate
    3/1/1998 12:00:00 AM
  • Firstpage
    861
  • Lastpage
    865
  • Abstract
    We lower-bound the error-correcting capabilities of the Hopfield (1982) network under error-tolerant conditions, given some distorted version of a fundamental memory with a random (typical) error pattern. Our main result is that for any sufficiently small α, and for any ρ<1/2, a Hopfield memory with n neurons can store αn fundamental memories, such that the following is satisfied in probability: a distorted fundamental memory with ρn errors, located at random positions may be corrected up to a residual error rate of exp{-1/2α}
  • Keywords
    Hopfield neural nets; content-addressable storage; error correction; fault tolerant computing; probability; random processes; system recovery; Hopfield memory; associative memory; content addressable memory; distorted fundamental memory; error-correcting capabilities; error-tolerant conditions; lower-bound; probability; random error pattern; random positions; residual error rate; typical error pattern recovery; Additive noise; Approximation methods; Deconvolution; Degradation; Eigenvalues and eigenfunctions; Gradient methods; Image restoration; Inverse problems; Optimization methods; Vectors;
  • fLanguage
    English
  • Journal_Title
    Information Theory, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9448
  • Type

    jour

  • DOI
    10.1109/18.661536
  • Filename
    661536