DocumentCode :
1343343
Title :
Typical error pattern recovery of the Hopfield memory under error-tolerant conditions
Author :
Burshtein, David
Author_Institution :
Dept. of Electr. Eng.-Syst., Tel Aviv Univ., Israel
Volume :
44
Issue :
2
fYear :
1998
fDate :
3/1/1998 12:00:00 AM
Firstpage :
861
Lastpage :
865
Abstract :
We lower-bound the error-correcting capabilities of the Hopfield (1982) network under error-tolerant conditions, given some distorted version of a fundamental memory with a random (typical) error pattern. Our main result is that for any sufficiently small α, and for any ρ<1/2, a Hopfield memory with n neurons can store αn fundamental memories, such that the following is satisfied in probability: a distorted fundamental memory with ρn errors, located at random positions may be corrected up to a residual error rate of exp{-1/2α}
Keywords :
Hopfield neural nets; content-addressable storage; error correction; fault tolerant computing; probability; random processes; system recovery; Hopfield memory; associative memory; content addressable memory; distorted fundamental memory; error-correcting capabilities; error-tolerant conditions; lower-bound; probability; random error pattern; random positions; residual error rate; typical error pattern recovery; Additive noise; Approximation methods; Deconvolution; Degradation; Eigenvalues and eigenfunctions; Gradient methods; Image restoration; Inverse problems; Optimization methods; Vectors;
fLanguage :
English
Journal_Title :
Information Theory, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9448
Type :
jour
DOI :
10.1109/18.661536
Filename :
661536
Link To Document :
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