DocumentCode
1343356
Title
New method for the analysis of dispersion characteristics of various planar transmission lines with finite metallization thickness
Author
Zhu, Lei ; Yamashita, Eikichi
Author_Institution
Dept. of Electr. Eng., Univ. of Electro-Commun., Tokyo, Japan
Volume
1
Issue
7
fYear
1991
fDate
7/1/1991 12:00:00 AM
Firstpage
164
Lastpage
166
Abstract
It is shown that the eigenfunction weighted boundary integral equation method can be extended to analyze the dispersion characteristics of various planar transmission lines with finite metallization thickness, such as microstrip lines, conductor-backed coplanar waveguides, and micro-coplanar strip lines. The computational results clearly demonstrate the effect of finite strip thickness on the propagation properties of these transmission lines for MMICs (monolithic microwave integrated circuits). Compared with the boundary element method, the advantages of the proposed method are that all of the boundary integral equations can be set up only on the surfaces of the finite strips and the interfaces between air and dielectric subregions but not on all closed surfaces. This is because both the field functions and the eigenfunctions satisfy the regular homogeneous boundary condition, and the effect of the edge on the strip can easily be handled theoretically.<>
Keywords
dispersion (wave); guided electromagnetic wave propagation; integral equations; strip lines; waveguide theory; MMICs; boundary integral equation method; conductor-backed CPW; coplanar waveguides; dispersion characteristics; eigenfunction weighted; finite metallization thickness; finite strip thickness; micro-coplanar strip lines; microstrip lines; monolithic microwave integrated circuits; planar transmission lines; propagation properties; Coplanar waveguides; Eigenvalues and eigenfunctions; Integral equations; MMICs; Metallization; Microstrip; Microwave propagation; Planar transmission lines; Planar waveguides; Strips;
fLanguage
English
Journal_Title
Microwave and Guided Wave Letters, IEEE
Publisher
ieee
ISSN
1051-8207
Type
jour
DOI
10.1109/75.84570
Filename
84570
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