A Study of Accelerated Storage Test Conditions Applicable to Semiconductor Devices and Microcircuits

This preliminary theoretical study on the application of accelerated stress testing for determining storage life of semiconductor devices and microcircuits has resulted in the following conclusions: There are more environmental stresses that can be applied to the accelerated testing of plastic encapsulated microcircuits, than hermetic devices. For hermetic devices, the assurance of initial hermeticity and wire bond integrity should insure long storage-dormancy life. Since only limited storage-dormancy data are available, accelerated testing and verification with use conditions data are necessary to support the conclusion of this study.