Theoretical analysis of the photocurrent dark decay in photorefractive media

Author

Vaveliuk, P. ; Ruiz, B. ; Duchowicz, R. ; Bolognini, N.

Author_Institution

Centro de Investigaciones Opt., La Plata, Argentina

Volume

36

Issue

6

fYear

2000

fDate

6/1/2000 12:00:00 AM

Firstpage

692

Lastpage

697

Abstract

The photocurrent dark decay in photorefractive materials is theoretically analyzed by using two different dynamical approaches-namely, the shallow traps and electron-hole transport models. The analysis is based on experimental results that show a double exponential decay of the photocurrent with short pulsed or continuous excitation. Expressions for the photocurrent amplitudes and decay times have been derived in terms of material and excitation parameters. Several dynamic behaviors are predicted for both models.

Keywords

electron mobility; hole mobility; photoconducting materials; photoconductivity; photorefractive materials; continuous excitation; decay times; double exponential decay; dynamic behaviors; dynamical approaches; electron-hole transport models; photocurrent amplitudes; photocurrent dark decay; photorefractive media; shallow traps; short pulsed excitation; theoretical analysis; Charge carriers; Crystalline materials; Crystals; Electron traps; Impurities; Photoconductivity; Photorefractive effect; Photorefractive materials; Predictive models; Temperature dependence;

fLanguage

English

Journal_Title

Quantum Electronics, IEEE Journal of

Publisher

ieee

ISSN

0018-9197

Type

jour

DOI

10.1109/3.845725

Filename

845725