Title :
Reliability Analysis of Multistate Device Networks
Author :
Gopal, Krishna ; Aggarwal, K.K. ; Gupta, J.S.
Author_Institution :
Assistant Prof. of Electrical Engineering; Regional Emgineering College; Kurukshetra 132119 INDIA.
Abstract :
The concept of disjoint dual (D-dual) is used for determining the reliability of complex networks composed of 3-state and/or 2-state devices. One need apply the D-dual successively twice for determining the reliability of 3-state device networks and networks with some 2-state and some 3-state devices. However, only one application is required for 2-state device networks. The method is relatively simple, computerizable, and gives a computationally economic reliability expression. There are illustrative examples.
Keywords :
Application software; Complex networks; Computer network reliability; Diodes; Failure analysis; Logic devices; Relays; Reliability theory; Set theory; Valves; D-Algorithm; D-Dual; Multistate devices; Network reliability evaluation; Reliability analysis;
Journal_Title :
Reliability, IEEE Transactions on
DOI :
10.1109/TR.1978.5220338