• DocumentCode
    1343522
  • Title

    Reliability Analysis of Multistate Device Networks

  • Author

    Gopal, Krishna ; Aggarwal, K.K. ; Gupta, J.S.

  • Author_Institution
    Assistant Prof. of Electrical Engineering; Regional Emgineering College; Kurukshetra 132119 INDIA.
  • Issue
    3
  • fYear
    1978
  • Firstpage
    233
  • Lastpage
    236
  • Abstract
    The concept of disjoint dual (D-dual) is used for determining the reliability of complex networks composed of 3-state and/or 2-state devices. One need apply the D-dual successively twice for determining the reliability of 3-state device networks and networks with some 2-state and some 3-state devices. However, only one application is required for 2-state device networks. The method is relatively simple, computerizable, and gives a computationally economic reliability expression. There are illustrative examples.
  • Keywords
    Application software; Complex networks; Computer network reliability; Diodes; Failure analysis; Logic devices; Relays; Reliability theory; Set theory; Valves; D-Algorithm; D-Dual; Multistate devices; Network reliability evaluation; Reliability analysis;
  • fLanguage
    English
  • Journal_Title
    Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/TR.1978.5220338
  • Filename
    5220338