DocumentCode :
1343590
Title :
A 1.8 V 1.0 GS/s 10b Self-Calibrating Unified-Folding-Interpolating ADC With 9.1 ENOB at Nyquist Frequency
Author :
Taft, Robert C. ; Francese, Pier Andrea ; Tursi, Maria Rosaria ; Hidri, Ols ; MacKenzie, Alan ; Hohn, Thomas ; Schmitz, Philipp ; Werker, Heinz ; Glenny, Andrew
Author_Institution :
Nat. Semicond., Unterhaching, Germany
Volume :
44
Issue :
12
fYear :
2009
Firstpage :
3294
Lastpage :
3304
Abstract :
An advance in folding-interpolating analog-to-digital converters (ADCs) is demonstrated which simplifies their extension to higher resolution by building the converter out of identical but scaled pipelined cascaded folding stages. In this unified folding architecture the parallel coarse channel has been eliminated by recursively using the previous folding stage as the coarse channel for each following cascaded stage. This new architecture is demonstrated in a 10-bit ADC using six cascaded folding-by-3 stages with a total folding order of 729. At 1.0 GS/s, this interleave-by-2 ADC achieves <±0.2 LSB DNL, ¿ ±0.5 LSB INL, 9.2 ENOB at 100 MHz input, 9.1 ENOB at Nyquist, and 8.8 ENOB at 1 GHz input. The value at FIN = 1 GHz is 1 ENOB higher than any value published to date. The power consumption from a single 1.8 V supply is 1.2 W/channel which includes the LVDS drivers for this dual-channel (I and Q each running at 1 GS/s) ADC.
Keywords :
analogue-digital conversion; cascade networks; interpolation; LVDS drivers; Nyquist frequency; calibrating unified-folding-interpolating analog-to-digital converters; coarse channel; effective number of bits; frequency 1 GHz; frequency 100 MHz; parallel coarse channel; power 1.2 W; voltage 1.8 V; Analog-digital conversion; Buildings; CMOS analog integrated circuits; CMOS technology; Calibration; Driver circuits; Energy consumption; Frequency conversion; Signal resolution; Voltage; Analog-to-digital conversion; CMOS analog integrated circuits; Nyquist converter; calibration; folding; high-speed techniques; interpolation; pipelined;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/JSSC.2009.2032634
Filename :
5342348
Link To Document :
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