• DocumentCode
    1343674
  • Title

    Spurious modes of the TLM-condensed node formulation

  • Author

    Nielsen, John

  • Author_Institution
    MEL-Defense Syst. Ltd., Stittsville, Ont., Canada
  • Volume
    1
  • Issue
    8
  • fYear
    1991
  • Firstpage
    201
  • Lastpage
    203
  • Abstract
    The TLM (transmission line matrix) method is based on temporal and spatial sampling of electromagnetic fields. As with he FDTD (finite-difference-time-domain) method, this results in dispersive effects and propagating spurious modes that corrupt the field solution. The general dispersion relation for the TLM condensed node is used to quantify the propagation attributes of these spurious modes. The propagating and evanescent spurious modes of the condensed TLM node formulation are derived. When the condensed node mesh is applied to problems involving scattering or source structures that have feature dimensions of several lattice spacings, high-order spatial modes are generated. These modes suffer significant dispersion effects. If the spatial frequency of the mode is sufficiently high, it will propagate as a spurious node with an incorrect propagation constant and in some cases with no loss. Spurious modes may have positive or negative group velocities.<>
  • Keywords
    dispersion relations; electromagnetic field theory; electromagnetic wave propagation; electromagnetic wave scattering; transmission line theory; EM fields; TLM-condensed node formulation; dispersion relation; electromagnetic fields; high-order spatial modes; propagation constant; scattering; source structures; spatial frequency; spatial sampling; spurious modes; temporal sampling; transmission line matrix; Dispersion; Electromagnetic fields; Electromagnetic propagation; Electromagnetic scattering; Finite difference methods; Lattices; Mesh generation; Sampling methods; Time domain analysis; Transmission line matrix methods;
  • fLanguage
    English
  • Journal_Title
    Microwave and Guided Wave Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1051-8207
  • Type

    jour

  • DOI
    10.1109/75.84587
  • Filename
    84587