Title :
Minimum Expected Loss Estimators of Reliability and Parameters of Certain Lifetime Distributions
Author :
Tummala, V.M.Rao ; Sathe, P.T.
Author_Institution :
Dept of Economics and Management Science; University of Detroit; Detroit, Michigan 48221 USA.
Abstract :
The estimators of reliability and parameters of certain lifetime distributions which are widely used in reliability, repairability, and maintainability are obtained by using a different form of loss function and minimizing the s-expected loss with respect to the posterior distribution. These estimators are called MELO estimators. The applications, and the comparison between MELO, Bayes, and Maximum likelihood estimators are discussed.
Keywords :
Art; Bayesian methods; Life estimation; Lifetime estimation; Maximum likelihood estimation; Parameter estimation; Reliability theory; Sampling methods; Shape; Weibull distribution; Bayes; Bayesian estimation; Exponential; Gamma; MELO estimator; Maximum likelihood; Weibull;
Journal_Title :
Reliability, IEEE Transactions on
DOI :
10.1109/TR.1978.5220373
