DocumentCode
1344100
Title
Electronics division: American Society for Quality Control
Issue
5
fYear
1978
Abstract
Provides a listing of current committee members and society officers.
Keywords
Engineering management; Jacobian matrices; Quality control; Quality management; Reliability engineering; Risk analysis; Safety; Semiconductor device reliability; Space technology; USA Councils;
fLanguage
English
Journal_Title
Reliability, IEEE Transactions on
Publisher
ieee
ISSN
0018-9529
Type
jour
DOI
10.1109/TR.1978.5220442
Filename
5220442
Link To Document