Title :
Scattering parameter characterization of microwave optoelectronic devices and fiber-optic networks
Author :
Iezekiel, Stavros ; Snowden, Christopher M. ; Howes, Michael J.
Author_Institution :
Dept. of Electron. & Electr. Eng., Leeds Univ., UK
Abstract :
A microwave fiber-optic network analyzer test set is proposed that will allow the application of two-port calibration theory to the measurement of optical and optoelectronic components in high frequency fiber-optic links. Formulae for the optoelectronic calibration are presented. A unified approach to optical and optoelectronic two-port calibration theory is covered.<>
Keywords :
S-parameters; optical fibres; optical links; optical testing; optoelectronic devices; fiber-optic network analyzer test set; fiber-optic networks; microwave optoelectronic devices; optoelectronic calibration; optoelectronic components; two-port calibration; two-port calibration theory; Calibration; Frequency measurement; Microwave measurements; Microwave theory and techniques; Optical devices; Optical fiber networks; Optical fiber testing; Optical fiber theory; Optical scattering; Scattering parameters;
Journal_Title :
Microwave and Guided Wave Letters, IEEE
