DocumentCode
1344196
Title
Scattering parameter characterization of microwave optoelectronic devices and fiber-optic networks
Author
Iezekiel, Stavros ; Snowden, Christopher M. ; Howes, Michael J.
Author_Institution
Dept. of Electron. & Electr. Eng., Leeds Univ., UK
Volume
1
Issue
9
fYear
1991
Firstpage
233
Lastpage
235
Abstract
A microwave fiber-optic network analyzer test set is proposed that will allow the application of two-port calibration theory to the measurement of optical and optoelectronic components in high frequency fiber-optic links. Formulae for the optoelectronic calibration are presented. A unified approach to optical and optoelectronic two-port calibration theory is covered.<>
Keywords
S-parameters; optical fibres; optical links; optical testing; optoelectronic devices; fiber-optic network analyzer test set; fiber-optic networks; microwave optoelectronic devices; optoelectronic calibration; optoelectronic components; two-port calibration; two-port calibration theory; Calibration; Frequency measurement; Microwave measurements; Microwave theory and techniques; Optical devices; Optical fiber networks; Optical fiber testing; Optical fiber theory; Optical scattering; Scattering parameters;
fLanguage
English
Journal_Title
Microwave and Guided Wave Letters, IEEE
Publisher
ieee
ISSN
1051-8207
Type
jour
DOI
10.1109/75.84598
Filename
84598
Link To Document