DocumentCode :
1344241
Title :
Method for characterization of intrinsic and extrinsic components of semiconductor laser diode circuit model
Author :
Majewski, Marian L. ; Novak, Dalma
Author_Institution :
Dept. of Electr. Eng., Queensland Univ., Brisbane, Qld., Australia
Volume :
1
Issue :
9
fYear :
1991
Firstpage :
246
Lastpage :
248
Abstract :
A simple method for the characterization of the intrinsic and extrinsic parameters of a semiconductor laser diode has been described. This method is based on the measurement of intensity noise, small-signal modulation response and input reflection coefficient of the device. The intrinsic 3-dB-modulation bandwidth and the extrinsic parasitic components associated with the device can be readily determined by using the analytical expressions presented. It has been shown that the major limitation of the 3-dB-modulation bandwidth can be attributed to the device chip RC time constant.<>
Keywords :
electron device noise; equivalent circuits; optical modulation; semiconductor device models; semiconductor junction lasers; 3-dB-modulation bandwidth; RC time constant; circuit model; extrinsic components; input reflection coefficient; intensity noise; intrinsic components; parasitic components; semiconductor laser diode; small-signal modulation response; Bandwidth; Diode lasers; Equivalent circuits; Frequency measurement; Intensity modulation; Laser modes; Noise measurement; Semiconductor device noise; Semiconductor device packaging; Semiconductor lasers;
fLanguage :
English
Journal_Title :
Microwave and Guided Wave Letters, IEEE
Publisher :
ieee
ISSN :
1051-8207
Type :
jour
DOI :
10.1109/75.84602
Filename :
84602
Link To Document :
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