• DocumentCode
    1344307
  • Title

    Discussion on ``A Reduction Technique for Obtaining Simplified Reliability Expression´´

  • Author

    Gopal, Krishna ; Rai, Suresh

  • Author_Institution
    Assistant Professor; Electrical Engineering Department; Regional Engineering College; Kurukshetra 132119 INDIA.
  • Issue
    1
  • fYear
    1979
  • fDate
    4/1/1979 12:00:00 AM
  • Firstpage
    66
  • Lastpage
    66
  • Abstract
    Case´s technique for obtaining a simplified reliability expression is discussed and supplemented with a few points. An example illustrates the importance of the order of terms selected for comparison.
  • Keywords
    Biographies; Boolean algebra; Educational institutions; Microelectronics; Reliability engineering; Reliability theory; Tellurium;
  • fLanguage
    English
  • Journal_Title
    Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/TR.1979.5220480
  • Filename
    5220480
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1344307