Title :
Discussion on ``A Reduction Technique for Obtaining Simplified Reliability Expression´´
Author :
Gopal, Krishna ; Rai, Suresh
Author_Institution :
Assistant Professor; Electrical Engineering Department; Regional Engineering College; Kurukshetra 132119 INDIA.
fDate :
4/1/1979 12:00:00 AM
Abstract :
Case´s technique for obtaining a simplified reliability expression is discussed and supplemented with a few points. An example illustrates the importance of the order of terms selected for comparison.
Keywords :
Biographies; Boolean algebra; Educational institutions; Microelectronics; Reliability engineering; Reliability theory; Tellurium;
Journal_Title :
Reliability, IEEE Transactions on
DOI :
10.1109/TR.1979.5220480
