مرکز منطقه ای اطلاع رساني علوم و فناوري - Tradeoff Between Hot Carrier and Negative Bias Temperature Degradations in High-Performance <formula formulatype="inline"> <img src="/images/tex/18914.gif" alt="\\hbox {Si}_{1 - x}\\hbox {Ge}_{x}"> </formula> pMOSFETs With High-<formula formulatype="inlin

DocumentCode :

1344471

Title :

Tradeoff Between Hot Carrier and Negative Bias Temperature Degradations in High-Performance $\\hbox {Si}_{1 - x}\\hbox {Ge}_{x}$ pMOSFETs With High-