Title :
Determining the effective number of bits of high resolution digitizers
Author :
Simöes, J. Basilio ; Loureiro, Custódio F M ; Landeck, Jorge ; Correia, Carlos M B A
Author_Institution :
Dept. de Fisica, Coimbra Univ., Portugal
fDate :
6/1/1997 12:00:00 AM
Abstract :
A new testing method has been used to evaluate the dynamic performance of several digitizing systems used in nuclear physics experiments. This method is useful for characterizing high resolution analog to digital converters when a pure enough signal source is not available. The signal to noise ratio of the digitizer, excluding the harmonic components from the noise, is the computed parameter. The use of this method to estimate jitter errors is also studied
Keywords :
analogue-digital conversion; detector circuits; electron device noise; nuclear electronics; bits; high resolution ADC; high resolution digitizers; jitter errors; signal to noise ratio; Analog-digital conversion; Dynamic range; Harmonic distortion; Jitter; Linearity; Manufacturing; Nuclear physics; Signal resolution; Signal to noise ratio; System testing;
Journal_Title :
Nuclear Science, IEEE Transactions on
