Electroluminescence yield for λ>165 nm in neon-xenon mixtures: experimental results

The electroluminescence yield for λ>165 nm in neon-xenon mixtures at a total pressure of about 800 torr, is studied as a function of the reduced electric field in a uniform-field gas proportional scintillation counter. Scintillation and ionization thresholds were experimentally observed to decrease monotonically as a function of xenon concentration, from approximately 1 and 6 Vcm^-1 torr^-1 for 100% xenon, to 0.5 and 3.8 Vcm^-1 torr^-1 for 20% xenon, to 0.4 and 2.8 Vcm^-1 torr^-1 for 10% xenon and to 0.3 and 2.2 Vcm^-1 torr^-1 for 5% xenon. Detector energy resolutions for the aluminum K_α line at 1.487 keV were determined to be 15% for 20% xenon, 19% for 10% xenon and 22% for 5% xenon mixtures