DocumentCode :
1344642
Title :
Reliability Estimates for the Truncated 2-Parameter Exponential Distribution
Author :
Beg, M.A.
Author_Institution :
Department of Mathematics; Monash University; Clayton, Victoria 3168 AUSTRALIA.
Issue :
2
fYear :
1979
fDate :
6/1/1979 12:00:00 AM
Firstpage :
161
Lastpage :
164
Abstract :
This paper derives the minimum variance unbiased estimates of the reliability function associated with the 2-parameter exponential distribution truncated from above at a known point. The Blackwell-Rao and Lehmann-Scheffé theorems are applied to censored samples. For comparison, maximum likelihood estimates are provided.
Keywords :
Cameras; Estimation theory; Exponential distribution; Life estimation; Life testing; Maximum likelihood estimation; Probability distribution; Random variables; Reliability theory; Statistical distributions; Minimum variance unbiased estimation, Truncated 2-parameter exponential distribution, Blackwell-Rao and Lehmann-Scheffé theorems, Maximum likelihood estimation;
fLanguage :
English
Journal_Title :
Reliability, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9529
Type :
jour
DOI :
10.1109/TR.1979.5220537
Filename :
5220537
Link To Document :
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