• DocumentCode
    1344656
  • Title

    Instrumentation: Computer-aided troubleshooting becomes easier and faster; automated testing of VLSI circuits poses challenges

  • Author

    Lerner, E.J.

  • Volume
    19
  • Issue
    1
  • fYear
    1982
  • Firstpage
    58
  • Lastpage
    60
  • Abstract
    Reports on recent developments in computer-aided test equipment. The automated testing of VLSI circuits is the focus of increasing competition.
  • Keywords
    automatic test equipment; integrated circuit testing; large scale integration; reviews; VLSI circuits; automated testing; computerised instrumentation; reviews; Circuit faults; Microcomputers; Oscilloscopes; Testing; Very large scale integration;
  • fLanguage
    English
  • Journal_Title
    Spectrum, IEEE
  • Publisher
    ieee
  • ISSN
    0018-9235
  • Type

    jour

  • DOI
    10.1109/MSPEC.1982.6366763
  • Filename
    6366763
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1344656