Title :
Instrumentation: Computer-aided troubleshooting becomes easier and faster; automated testing of VLSI circuits poses challenges
Abstract :
Reports on recent developments in computer-aided test equipment. The automated testing of VLSI circuits is the focus of increasing competition.
Keywords :
automatic test equipment; integrated circuit testing; large scale integration; reviews; VLSI circuits; automated testing; computerised instrumentation; reviews; Circuit faults; Microcomputers; Oscilloscopes; Testing; Very large scale integration;
Journal_Title :
Spectrum, IEEE
DOI :
10.1109/MSPEC.1982.6366763
