DocumentCode
1344695
Title
Microwave characterization and modeling of the surface impedance of fractal structure copper films
Author
Troncet, Emmanuel ; Ablart, Guy ; Allam, Levi
Author_Institution
L.M.E.Q., Univ. Paul Sabatier, Toulouse, France
Volume
46
Issue
3
fYear
1998
fDate
3/1/1998 12:00:00 AM
Firstpage
434
Lastpage
441
Abstract
The surface impedances of two thin metallic films of different fractal structures realized on printed circuits have been measured in free-space over the frequency range [10 GHz-20 GHz]. A modeling scheme based on Maxwell´s equations and Fresnel´s diffraction theory is proposed
Keywords
Maxwell equations; copper; electric impedance measurement; electromagnetic wave diffraction; fractals; metallic thin films; microwave measurement; printed circuits; 10 to 20 GHz; Cu; Fresnel´s diffraction theory; Maxwell´s equations; fractal structure copper films; free-space; metallic films; microwave characterization; printed circuits; surface impedance; Antenna measurements; Copper; Fractals; Impedance measurement; Printed circuits; Surface impedance; Surface morphology; Surface resistance; Surface waves; Testing;
fLanguage
English
Journal_Title
Antennas and Propagation, IEEE Transactions on
Publisher
ieee
ISSN
0018-926X
Type
jour
DOI
10.1109/8.662663
Filename
662663
Link To Document