Title :
Microwave characterization and modeling of the surface impedance of fractal structure copper films
Author :
Troncet, Emmanuel ; Ablart, Guy ; Allam, Levi
Author_Institution :
L.M.E.Q., Univ. Paul Sabatier, Toulouse, France
fDate :
3/1/1998 12:00:00 AM
Abstract :
The surface impedances of two thin metallic films of different fractal structures realized on printed circuits have been measured in free-space over the frequency range [10 GHz-20 GHz]. A modeling scheme based on Maxwell´s equations and Fresnel´s diffraction theory is proposed
Keywords :
Maxwell equations; copper; electric impedance measurement; electromagnetic wave diffraction; fractals; metallic thin films; microwave measurement; printed circuits; 10 to 20 GHz; Cu; Fresnel´s diffraction theory; Maxwell´s equations; fractal structure copper films; free-space; metallic films; microwave characterization; printed circuits; surface impedance; Antenna measurements; Copper; Fractals; Impedance measurement; Printed circuits; Surface impedance; Surface morphology; Surface resistance; Surface waves; Testing;
Journal_Title :
Antennas and Propagation, IEEE Transactions on
