Title :
Possible three-terminal device with YBCO angle grain boundary
Author :
Chen, J. ; Yamashita, T. ; Sasahara, H. ; Suzuki, H. ; Kurosawa, H. ; Hirotsu, Y.
Author_Institution :
Dept. of Electron., Nagaoka Univ. of Technol., Japan
fDate :
6/1/1991 12:00:00 AM
Abstract :
The DC and AC Josephson effects were observed in YBa/sub 2/Cu/sub 3/O/sub 7-a/ (YBCO) bridges with metal-organic chemical vapor deposited (MOCVD) thin films on
Keywords :
CVD coatings; Josephson effect; X-ray diffraction examination of materials; barium compounds; high-temperature superconductors; superconducting junction devices; transmission electron microscope examination of materials; yttrium compounds; AC Josephson effects; DC Josephson effects; MOCVD; MgO; Si; SrTiO/sub 3/; TEM observations; X-ray analysis; YBa/sub 2/Cu/sub 3/O/sub 7-a/; angle grain boundaries; high-temperature superconductors; insulated gate; semiconducting barrier junction property; supercurrent; three-terminal device; Bridges; Chemicals; Grain boundaries; Josephson effect; Josephson junctions; Semiconductivity; Semiconductor thin films; Sputtering; Substrates; Yttrium barium copper oxide;
Journal_Title :
Applied Superconductivity, IEEE Transactions on
