Title :
Measurement of the spatial resolution of wide-pitch silicon strip detectors with large incident angle
Author :
Kawasaki, T. ; Hazumi, M. ; Nagashima, Y. ; Senyo, K. ; Sumisawa, K. ; Tagegai, T. ; Haba, J. ; Matsuda, T. ; Ozaki, H. ; Tsuboyama, T.
Author_Institution :
Graduate Sch. of Sci., Osaka Univ., Japan
fDate :
6/1/1997 12:00:00 AM
Abstract :
As a part of R&D for the BELLE experiment at KEK-B, we measured the spatial resolution of silicon strip detectors for particles with incident angles ranging from 0° to 75°. These detectors have strips with pitches of 50, 125 and 250 μm on the ohmic side. We have obtained the incident angle dependence which agreed well with a Monte Carlo simulation. The resolution was found to be 11 μm for normal incidence with a pitch of 50 μm, and 29 μm for incident angle of 75° with a pitch of 250 μm
Keywords :
Monte Carlo methods; silicon radiation detectors; 125 mum; 250 mum; 50 mum; BELLE experiment; Monte Carlo simulation; Si; incident angle dependence; spatial resolution; wide-pitch silicon strip detectors; Capacitance; Decision support systems; Detectors; Laboratories; Particle measurements; Physics; Silicon; Spatial resolution; Strips; Testing;
Journal_Title :
Nuclear Science, IEEE Transactions on
