Title :
Current distribution, resistance, and inductance for superconducting strip transmission lines
Author :
Sheen, D.M. ; Ali, S.M. ; Oates, D.E. ; Withers, R.S. ; Kong, J.A.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., MIT, Cambridge, MA, USA
fDate :
6/1/1991 12:00:00 AM
Abstract :
A method for the calculation of the current distribution, resistance, and inductance matrices for a system of coupled superconducting transmission lines having finite rectangular cross-section is presented. These calculations allow accurate characterization of both high-T/sub c/ and low-T/sub c/ superconducting strip transmission lines. For a single stripline geometry with finite ground planes, the current distribution, resistance, inductance, and kinetic inductance are calculated as functions of the penetration depth for various film thicknesses. These calculations are then used to determine the penetration depth for Nb, NbN, and YBa/sub 2/Cu/sub 3/O/sub 7-x/ superconducting thin films from the measured temperature dependence of the resonant frequency of a stripline resonator. The calculations are also used to convert measured temperature dependence of the quality factor to the intrinsic surface resistance as a function of temperature for an Nb stripline resonator.<>
Keywords :
barium compounds; high-temperature superconductors; niobium; niobium compounds; penetration depth (superconductivity); strip lines; superconducting cables; superconducting thin films; yttrium compounds; Nb; NbN; YBa/sub 2/Cu/sub 3/O/sub 7-x/; current distribution; finite ground planes; finite rectangular cross-section; high-temperature superconductors; inductance; intrinsic surface resistance; kinetic inductance; low-temperature superconductors; penetration depth; quality factor; resistance; resonant frequency; stripline geometry; stripline resonator; superconducting strip transmission lines; Current distribution; Electrical resistance measurement; Inductance; Niobium; Stripline; Superconducting films; Superconducting transmission lines; Surface resistance; Temperature dependence; Temperature measurement;
Journal_Title :
Applied Superconductivity, IEEE Transactions on
