DocumentCode :
1345010
Title :
High efficiency detection of tritium using silicon avalanche photodiodes
Author :
Shah, K.S. ; Gothoskar, P. ; Farrell, R. ; Gordon, J.
Author_Institution :
RMD Inc., Watertown, MA, USA
Volume :
44
Issue :
3
fYear :
1997
fDate :
6/1/1997 12:00:00 AM
Firstpage :
774
Lastpage :
776
Abstract :
This paper describes our recent work in developing low noise silicon avalanche photodiodes (APD) for detection of tritium (3 H) β-particles with high efficiency. In view of the very low energy of 3H β-particles (Emax=18 keV), research was carried out to produce APD structures with a very thin entrance window. This involved using low energy boron implantation into the APD front surface, followed by pulsed excimer laser annealing of the implanted face to form a p+ contact. The resulting devices had a surface dead layer of about 0.07 to 0.1 μm and operated with a low noise threshold (250-300 eV) for 2×2 mm2 size. The 3H β-particle detection efficiency was measured to be approximately 50%. This is about the twice the detection efficiency achieved with standard APDs
Keywords :
avalanche photodiodes; beta-ray detection; boron; laser beam annealing; silicon radiation detectors; β-particle detection efficiency; β-particles; 18 keV; 2 mm; 250 to 300 eV; Si avalanche photodiodes; Si:B; T; T detection; high efficiency; low noise; p+ contact; pulsed excimer laser annealing; Annealing; Boron; Electrodes; Optical pulses; Photodiodes; Signal to noise ratio; Silicon; Solid scintillation detectors; Surface emitting lasers; Testing;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/23.603750
Filename :
603750
Link To Document :
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