• DocumentCode
    1345010
  • Title

    High efficiency detection of tritium using silicon avalanche photodiodes

  • Author

    Shah, K.S. ; Gothoskar, P. ; Farrell, R. ; Gordon, J.

  • Author_Institution
    RMD Inc., Watertown, MA, USA
  • Volume
    44
  • Issue
    3
  • fYear
    1997
  • fDate
    6/1/1997 12:00:00 AM
  • Firstpage
    774
  • Lastpage
    776
  • Abstract
    This paper describes our recent work in developing low noise silicon avalanche photodiodes (APD) for detection of tritium (3 H) β-particles with high efficiency. In view of the very low energy of 3H β-particles (Emax=18 keV), research was carried out to produce APD structures with a very thin entrance window. This involved using low energy boron implantation into the APD front surface, followed by pulsed excimer laser annealing of the implanted face to form a p+ contact. The resulting devices had a surface dead layer of about 0.07 to 0.1 μm and operated with a low noise threshold (250-300 eV) for 2×2 mm2 size. The 3H β-particle detection efficiency was measured to be approximately 50%. This is about the twice the detection efficiency achieved with standard APDs
  • Keywords
    avalanche photodiodes; beta-ray detection; boron; laser beam annealing; silicon radiation detectors; β-particle detection efficiency; β-particles; 18 keV; 2 mm; 250 to 300 eV; Si avalanche photodiodes; Si:B; T; T detection; high efficiency; low noise; p+ contact; pulsed excimer laser annealing; Annealing; Boron; Electrodes; Optical pulses; Photodiodes; Signal to noise ratio; Silicon; Solid scintillation detectors; Surface emitting lasers; Testing;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/23.603750
  • Filename
    603750