• DocumentCode
    1345057
  • Title

    Radiation hardness of silicon detectors: current status

  • Author

    Wunstorf, R.

  • Author_Institution
    Dortmund Univ., Germany
  • Volume
    44
  • Issue
    3
  • fYear
    1997
  • fDate
    6/1/1997 12:00:00 AM
  • Firstpage
    806
  • Lastpage
    814
  • Abstract
    Silicon detectors are used or going to be used as tracking devices in many high energy physics experiments. Therefore they are located close to the interaction point, where the detectors are exposed to very high particle fluxes and ionization doses, especially in future experiments with very high energies and luminosities. Ongoing investigations concerning the radiation damage, started already several years ago, include bulk and surface damage related questions. The two main objectives of these studies are: (1) predict the radiation induced change in the detector parameters expected for any application, and (2) improve the radiation hardness of the detectors. A general overview of the current progress of the radiation hardness studies towards these goals is given here
  • Keywords
    radiation hardening (electronics); silicon radiation detectors; Si; Si detectors; bulk damage; radiation damage; radiation hardness; surface damage; Energy exchange; Energy loss; Ionization; Ionizing radiation; Mesons; Neutrons; Physics; Protons; Radiation detectors; Silicon radiation detectors;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/23.603757
  • Filename
    603757