DocumentCode
1345057
Title
Radiation hardness of silicon detectors: current status
Author
Wunstorf, R.
Author_Institution
Dortmund Univ., Germany
Volume
44
Issue
3
fYear
1997
fDate
6/1/1997 12:00:00 AM
Firstpage
806
Lastpage
814
Abstract
Silicon detectors are used or going to be used as tracking devices in many high energy physics experiments. Therefore they are located close to the interaction point, where the detectors are exposed to very high particle fluxes and ionization doses, especially in future experiments with very high energies and luminosities. Ongoing investigations concerning the radiation damage, started already several years ago, include bulk and surface damage related questions. The two main objectives of these studies are: (1) predict the radiation induced change in the detector parameters expected for any application, and (2) improve the radiation hardness of the detectors. A general overview of the current progress of the radiation hardness studies towards these goals is given here
Keywords
radiation hardening (electronics); silicon radiation detectors; Si; Si detectors; bulk damage; radiation damage; radiation hardness; surface damage; Energy exchange; Energy loss; Ionization; Ionizing radiation; Mesons; Neutrons; Physics; Protons; Radiation detectors; Silicon radiation detectors;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/23.603757
Filename
603757
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