DocumentCode :
1345191
Title :
R & M of Socketed ICs
Author :
Erickson, J.M. ; Townes, W.D. ; Leary, J.F.
Author_Institution :
US Army Electronics R&D Command; DELET-IR; Fort Monmouth, NJ 07703 USA.
Issue :
5
fYear :
1979
Firstpage :
338
Lastpage :
343
Abstract :
This study shows that sockets can be reliable enough in a relatively benign environment for the short-term. Criteria for failure-free performance include 1) operation in a controlled, non-vibration environment, 2) gold-plated, machined sockets, 3) either gold or tin-plated IC leads. Accelerated testing is required to estimate long-term reliability. Numerous federal and commercial systems use socketed integrated circuits (ICs) satisfactorily. Maintainability of circuit boards, ease of equipment upgrading, and simplifying transition from development to production are some of the advantages of sockets.
Keywords :
Circuit testing; Electronic equipment testing; Electronics packaging; FAA; Life estimation; Performance evaluation; Printed circuits; Research and development; Sockets; Springs; Accelerated test; IC socket; IC socket reliability; Printed circuit board; Wire-wrapped board;
fLanguage :
English
Journal_Title :
Reliability, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9529
Type :
jour
DOI :
10.1109/TR.1979.5220636
Filename :
5220636
Link To Document :
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