• DocumentCode
    1345250
  • Title

    Characterization of a prototype pixel array detector (PAD) for use in microsecond framing time-resolved X-ray diffraction studies

  • Author

    Barna, S.L. ; Shepherd, J.A. ; Tate, M.W. ; Wixted, R.L. ; Eikenberry, E.F. ; Gruner, S.M.

  • Author_Institution
    Dept. of Phys., Princeton Univ., NJ, USA
  • Volume
    44
  • Issue
    3
  • fYear
    1997
  • fDate
    6/1/1997 12:00:00 AM
  • Firstpage
    950
  • Lastpage
    956
  • Abstract
    A 4 by 4 pixel array device has been designed and built as a prototype for a high-speed two-dimensional X-ray imaging detector. This detector is a two-tier device with an X-ray sensitive photo-diode array bump-bonded to a 1.2 micrometer CMOS analog integrated circuit. Each 150 micrometer square pixel of the detective layer is matched to a corresponding section of the electronics. Each pixel of the electronics is capable of integrating the signal from the diode for the desired framing time, storing the result in one of eight storage capacitors and sequentially outputting the stored value to an on chip buffering op amp. Tests of the electronics have demonstrated a full-well (per pixel, per frame) of over 10.500 12 keV X-rays with an electronics noise level corresponding to less than 2.8 12 keV X-rays. Speed tests indicate the ability to integrate to the full-well within 2 microseconds (an average pixel count-rate of 5.2 GHz). We present detailed characterizations of the performance of this initial device, including an analysis of noise, stability, linearity and point spread. In addition, we will discuss plans for large scale integration towards the goal of a 1024 by 1024 pixel detector
  • Keywords
    CMOS analogue integrated circuits; X-ray diffraction; detector circuits; large scale integration; nuclear electronics; semiconductor device noise; silicon radiation detectors; 1.2 mum; 12 keV; 150 micron; 2 mus; CMOS analog integrated circuit; electronics noise level; large scale integration; linearity; photo-diode array; pixel array detector; point spread; stability; time-resolved X-ray diffraction; two-dimensional X-ray imaging detector; Atherosclerosis; Buffer storage; CMOS analog integrated circuits; Electronic equipment testing; Pixel; Prototypes; Sensor arrays; X-ray detection; X-ray detectors; X-ray imaging;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/23.603783
  • Filename
    603783