• DocumentCode
    1345538
  • Title

    High-performance thin-film transistors fabricated using excimer laser processing and grain engineering

  • Author

    Giust, G.K. ; Sigmon, T.W.

  • Author_Institution
    Dept. of Electr. Eng., Arizona State Univ., Tempe, AZ, USA
  • Volume
    45
  • Issue
    4
  • fYear
    1998
  • fDate
    4/1/1998 12:00:00 AM
  • Firstpage
    925
  • Lastpage
    932
  • Abstract
    High-performance polysilicon thin-film transistors (TFTs) are fabricated using an excimer laser to recrystallize the undoped channel and dope the source-drain regions. Using a technique we call “grain engineering” we are able to control grain microstructure using laser parameters. Resulting polysilicon films are obtained with average grain sizes of ~4-9×m in sub-100 nm thick polysilicon films without substrate heating during the laser recrystallization process. Using a simple four-mask self-aligned aluminum top-gate structure, we fabricate TFTs in these films. By combining the grain-engineered channel polysilicon regions with laser-doped source-drain regions, TFTs are fabricated with electron mobilities up to 260 cm2/Vs and on/off current ratios greater than 107. To our knowledge, these devices represent the highest performance laser-processed TFTs reported to date fabricated without substrate heating or hydrogenation
  • Keywords
    electron mobility; elemental semiconductors; grain size; laser materials processing; recrystallisation; semiconductor doping; silicon; thin film transistors; Si; electron mobility; excimer laser recrystallization; fabrication; floating body effects; four-mask self-aligned aluminum top-gate; gas immersion laser doping; grain engineering; grain size; microstructure; on/off current ratio; polysilicon thin film transistor; Annealing; Crystallization; Doping; Gas lasers; Glass; Heating; Microstructure; Semiconductor films; Substrates; Thin film transistors;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.662804
  • Filename
    662804