Title :
3-State and 5-State Reliability Models
Author :
Ansell, J. ; Bendell, A. ; Humble, S. ; Mudhar, C.S.
Author_Institution :
Department of Mathematics and Statistics; Keele University; Keele ENGLAND.
fDate :
6/1/1980 12:00:00 AM
Abstract :
This note considers models for devices subject to 1) partial and catastrophic failure, repair and replacement 2) each of two types of partial and catastrophic failures.
Keywords :
Biographies; Cities and towns; Degradation; Educational institutions; Markov processes; Mathematical model; Mathematics; Reliability theory; Statistics; Steady-state; 3-state device; 5-state device; Failure to idle; Failure to operate; Partial failure; Repair;
Journal_Title :
Reliability, IEEE Transactions on
DOI :
10.1109/TR.1980.5220772
