• DocumentCode
    1346148
  • Title

    Cumulative Damage Model with Correlated Interarrival Times of Shocks

  • Author

    Sathiyamoorthi, R.

  • Author_Institution
    Annamalai University, Annamalainagar; 57, Kamaleeswaran Koil Street; Chidambaram - 608 001; Tamil Nadu INDIA
  • Issue
    3
  • fYear
    1980
  • Firstpage
    249
  • Lastpage
    249
  • Abstract
    A machine is exposed to a cumulative damage process. The damages are caused by shocks whose interarrival times are constantly correlated and exponentially distributed. Using the distribution of the exchangeable random variables, the life time distribution, its mean and variance are calculated.
  • Keywords
    Arithmetic; Electric shock; Inventory control; Magnetic heads; Mathematics; Random variables; Reliability theory; Statistical distributions; Statistics; Cumulative damage; Exchangeable random variables;
  • fLanguage
    English
  • Journal_Title
    Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/TR.1980.5220811
  • Filename
    5220811
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1346148