Title :
Comment on "A Reparable Multistate Device
Author :
Muth, Eginhard J.
Author_Institution :
Department of Industrial and Systems Engineering; University of Florida; Gainesville, Florida 32611 USA.
Abstract :
The reliability, time-dependent availability, and steady-state availability of a system that can fail in n different modes are derived in an alternate and more general way to the Elsayed & Zebib 1979 paper.
Keywords :
Availability; Convolution; Differential equations; Laplace equations; Materials handling; Reliability engineering; Reliability theory; Steady-state; Stochastic systems; Systems engineering and theory; Law of total probability; Multistate systems;
Journal_Title :
Reliability, IEEE Transactions on
DOI :
10.1109/TR.1980.5220822
